Practical Electron Microscopy and Database

An Online Book, Second Edition by Dr. Yougui Liao (2006)

Practical Electron Microscopy and Database - An Online Book

Chapter/Index: Introduction | A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z | Appendix

Displacement Energy for Bulk and Surface Diffusion Induced by Electron Irradiation

Displacement energy (Ed) for bulk diffusion in conducting materials induced by electron irradiation is from 0.5 to 1.5 eV, while it for surface diffusion is < 1 eV. Energetic electron induced elastic scattering can also enhance diffusion of atoms at the surface [1] or vacancy migration in the bulk, which have relatively high cross sections and thus require energy of the order of 1eV or less.

 

[1] Y. Ma, L.D.Marks,in: G. W. Bailey (Ed.), Proc. 44th Ann. Meet. Electron Microsc. Soc.Am., San Francisco Press,San Francisco, 1986.