Practical Electron Microscopy and Database

Chapter/Index: Introduction | A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z | Appendix

Knock-on/Elemental (Atomic) Displacement Threshold of Chemical Elements due to Electron Irradiation at Sample Surface

The knock-on threshold of chemical elements due to electron irradiation at a sample surface is much smaller than that for bulk materials. Therefore, it is much easier to damage thin TEM specimens.