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Knock-on/Elemental (Atomic) Displacement Threshold of
Chemical Elements due to Electron Irradiation at Sample Surface
- Practical Electron Microscopy and Database -
- An Online Book -
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https://www.globalsino.com/EM/
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This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
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The knock-on threshold of chemical elements due to electron irradiation at a sample surface is much smaller than that for bulk materials. Therefore, it is much easier to damage thin TEM specimens.
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The book author (Yougui Liao) welcomes your comments, suggestions, and corrections, please click here for submission. If you let book author know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page.
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