Factors Limiting Imaging and Spectroscopy in TEM
- Practical Electron Microscopy and Database -
- An Online Book -



This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers. How to Cite This Book



As problems associated with electron optics and stability have been overcome, for instance, when field-emission sources and aberration-corrected TEM lenses have been used, radiation damage becomes the main physical limit to imaging and spectroscopy in a TEM.



The book author (Dr. Liao) welcomes your comments, suggestions, and corrections, please click here for submission.

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