Practical Electron Microscopy and Database

An Online Book, Second Edition by Dr. Yougui Liao (2006)

Practical Electron Microscopy and Database - An Online Book

Chapter/Index: Introduction | A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z | Appendix

Factors Limiting Imaging and Spectroscopy in TEM

As problems associated with electron optics and stability have been overcome, for instance, when field-emission sources and aberration-corrected TEM lenses have been used, radiation damage becomes the main physical limit to imaging and spectroscopy in a TEM.