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Introduction of Cross Section of Scatterings
- Practical Electron Microscopy and Database -
- An Online Book -
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https://www.globalsino.com/EM/
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This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
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Cross section of scattering measures the probability that an event occurs, given by,
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where N -- Events per volume (sites/cm3)
ni -- Number incident particles per unit area (particles/cm2)
nt -- Number target sites per volume (sites/cm3)
Q has units of cm2 and is considered as an effective ‘size’ which the atom presents as a target to incident particles.
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The book author (Yougui Liao) welcomes your comments, suggestions, and corrections, please click here for submission. If you let book author know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page.
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