Practical Electron Microscopy and Database

An Online Book, Second Edition by Dr. Yougui Liao (2006)

Practical Electron Microscopy and Database - An Online Book

Chapter/Index: Introduction | A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z | Appendix

Cross Section of K-Shell Ionization

Hydrogenic model and Hartree-Slater model give good results for evaluating the K-shell excitation cross-section. A comparison of K-edge and cross-section profiles for low atomic number (Z) elements [1] shows that the cross-section profiles present the K-edge roughly for an edge where the fine structures are important, e.g. for boron nitride (BN).

Figure 4614 shows the cross section of K-shell ionization process in Al as a function of the incident electron energy at the scattering angles of ~ 0°. For comparison, the figure also shows cross sections for the elastic and various inelastic scattering processes.

Cross sections for the various elastic and inelastic scattering processes in Al as a function of the incident electron energy

Figure 4614. Cross sections for the elastic and various inelastic scattering processes in Al as a function of
the incident electron energy at scattering angles of ~ 0°.

Based on a non-relativistic theory, Allen and Rossouw [2] calculated the inelastic object functions for K-shell ionization. The calculated object functions for the K-shell excitations of some elements such as Te, Cd, As and Ga indicate that the localization of the object is less than 1 Å [3].

 

 

 


 

 

 

[1] Ahn C. and Rez P., Ultramicroscopy 17 (1985) 105.
[2] L.J. Allen, C.J. Rossouw, Phys. Rev. B 42 (1990) 11644–11654.
[3] N.D. Browning, S.J. Pennycook, Microbeam Anal. 2 (1993) 81–89.