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Cross Section of High-Angle Scattering of Electrons
- Practical Electron Microscopy and Database -
- An Online Book -
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https://www.globalsino.com/EM/
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This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
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At angles higher than 50 mrad, we can consider the scattering follows Rutherford’s law, i.e. the scattering cross section is proportional to Z2. For instance, high-angle annular dark-field (HAADF) technique uses this principle to analyze the local chemical composition in materials.
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The book author (Yougui Liao) welcomes your comments, suggestions, and corrections, please click here for submission. If you let book author know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page.
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