Experts in the Field of Electron Microscopies
- Practical Electron Microscopy and Database -
- An Online Book -  


This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.



Last name First name Title Organization Website Email
Alexander  Duncan Dr. Centre Interdisciplinaire de Microscopie Electronique (CIME) 
Cantoni Marco Dr. Centre Interdisciplinaire de Microscopie Electronique (CIME-GE) 
Cazaux J.   LASSI/UTAP Faculté des Sciences, France    
Egerton R. F. Prof. Portland State University 
Haider Maximilian Dr. CEOS corrected electron optical systems GmbH  
Ikeda Masaki
Isabell Thomas Dr./Director JEOL USA, TEM Product Division    
Jepson Mark  
Krumeich Frank Dr. ETH Zürich
Kundmann Mike   Gatan Inc.    
O’Keefe M.A.   National Center for Electron Microscopy, Lawrence Berkeley National Laboratory
Sawada Hidetaka   JEOL, Japan
Sidorov Maxim V.
Verbeeck Jo   EMAT, University of Antwerp, Belgium
Yacaman Miguel Dr./Chair UTSA physics and astronomy department  
Zhu Yimei Dr./Prof. Brookhaven National Lab
Zach Joachim Dr. CEOS corrected electron optical systems GmbH  

Note: Dr. -- PhD
         Prof. -- Professor
         Stu -- Student
         Tech -- Technician
         Man -- Manager


The book author (Dr. Liao) welcomes your comments, suggestions, and corrections, please click here for submission. You can click How to Cite This Book to cite this book. If you let Dr. Liao know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page. This appearance can help advertise your publication.

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