Practical Electron Microscopy and Database

Chapter/Index: Introduction | A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z | Appendix

Contrast Dependence on Negative Potential on the Sample

In SEM observations, if the sample is biased with a negative potential V0 it can be assured that all secondary electrons (SEs) within the region of interest are emitted.