This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.

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One of the important parameter characterising the EELS detection and camera systems is its dynamic range. For EELS, serial acquisition can cope better with spectra containing the zero loss peak (involving elastic and quasi-elastic scattered electrons only), where signal fluctuation is in excess of 10⁵. In parallel detection systems, some form of signal attenuation has to be applied to reduce the intensity of the strong signal to the detector designed for single electron collection.