EDS Measurements of Minor and/or Trace Elements
- Practical Electron Microscopy and Database -
- An Online Book -
Electron microscopy
  Microanalysis | EM Book                                                                   http://www.globalsino.com/EM/  


When minor and/or trace elements are of interest, a high deadtime, e.g. 30–40%, should still be used to record the spectrum regardless of the artifacts such as escape peaks, pulse pileup and peak distortion at high deadtime.