Spatial Resolution/Resolving Power Affected by Beam Alignments
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/  



 
This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

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The alignment of objective lens in EMs is very critical and needs to be performed extremely carefully. Misalignment of the objective lens increases the spherical aberration and the sensitivity of the chromatic aberration so that it seriously reduces the resolving power (spatial resolution) of the microscope.

 

 

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