Avoid Damaging Fragile TEM Samples
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/  



 
This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

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If the TEM specimen is very fragile and is easily damaged during the observation, the experiment must be done with the minimum dose of electron beam. In such cases, the signal acquisition is needed to be compromised by costing some benefits. For instance, the counting efficiency of EELS linescan can be optimized at the cost of energy resolution by binning multiple channels.

 

 

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