Artifacts in Electron Holography Measurements
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/  



 
This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

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The electron waves involved in the creation of holograms should not have their phase shifted by anything but the object in the TEM specimen. Otherwise, the information involved in the wave will be deteriorated and then all the information about the object cannot be encoded accurately or is lost.

To avoid diffraction-induced artifacts, the electron hologram should be recorded under weak diffraction conditions by tilting the specimen several degrees away from the major zone axes.

However, in reality, the phase shift is not only proportional to the electrostatic potential of the object in the TEM specimen but also modified by defects, strain, composition, crystalline shape and orientation and surface structure.

 

 

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