This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

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Assuming the TEM sample satisfies the weak phase object approximation (WPOA), the PED measurements benefit from the small size of nanometer crystals, because as the crystal becomes smaller its shape amplitude extends in reciprocal space. Therefore, more diffraction spots will appear in the PED patterns because the diffracted electron beams intersects on the Ewald sphere with the plane recording medium of the TEM.