Phase-Contrast Microscopy
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/  



 
This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

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High-resolution transmission microscopy (HRTEM) uses both the direct electron beam (wave) and several diffracted electron beams (waves) to form the image. In this way, the resolution is improved with the multiple beams comparing to bright field imaging because higher spatial frequencies are included. Due to their phase differences the interfere between the beams results in an interference pattern in the image plane of the objective lens. Therefore, HRTEM is also a type of phase-contrast microscopy.

 

 

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The book author (Yougui Liao) welcomes your comments, suggestions, and corrections, please click here for submission. If you let book author know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page.