Interference between Direct and Diffracted Beams in TEM
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/  



 
This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

=================================================================================

In TEM, when the transmitted beam and a diffracted beam (e.g. from (hkl) plane) pass through a large objective aperture, interference takes place between the transmitted and diffracted beam, resulting in one-dimensional (1D) lattice fringes of the (hkl) plane. When more diffracted beams together with the transmitted beam pass through, then two-dimensional (2D) high-resolution lattice fringes are obtained.

 

 

=================================================================================

The book author (Yougui Liao) welcomes your comments, suggestions, and corrections, please click here for submission. If you let book author know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page.