Median Time to Failure (MTTF) to Electromigration
- Practical Electron Microscopy and Database -
- An Online Book -

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Different from mean time to failure (MTTF), median time to failure (t50) is defined to occur when 50% devices have failed so that half of the failures happen prior to time t50 and remaining half after t50. t50 mostly arises in the statistical and mathematical analysis of failure distributions. MTTF is related to the number, type, and distribution of structural defects [1].

 

 

 

 

 

[1] Attardo, MJ; Rosenber.R , Electromigration Damage in Aluminum Film Conductors, Journal of Applied Physics,  41(6)  2381.  DOI: 10.1063/1.1659233.

 

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