Evaluation of Grain Size by XRD Technique - Practical Electron Microscopy and Database - - An Online Book - |
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Microanalysis | EM Book https://www.globalsino.com/EM/ | ||||||||
This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers. | ||||||||
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In XRD measurements, the grain size (D) is evaluated using Scherrer’s formula, D = (k·λ) /(b·cosθ) ------------------------------------- [3160a] where, The wavelength of other radiations is given by, -------------------------------- [3160b] Here, the X-ray photon energy (E) is listed in page4672.
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The book author (Yougui Liao) welcomes your comments, suggestions, and corrections, please click here for submission. If you let book author know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page. | ||||||||
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