Electron microscopy
 
TEM Analysis of Metallic Materials
- Practical Electron Microscopy and Database -
- An Online Book -
Microanalysis | EM Book                                                                                   http://www.globalsino.com/EM/        

This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
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In TEM analysis, most ceramics and catalysts suffer radiation damages under electron beams with accelerating voltages of 80-300 kV (especially in FEG TEMs due to high current densities), while most of metallic materials are not affected by such incident electron beams.

 

 

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The book author (Yougui Liao) welcomes your comments, suggestions, and corrections, please click here for submission. If you let book author know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page.