Electron microscopy
Line Defects
- Practical Electron Microscopy and Database -
- An Online Book -
Microanalysis | EM Book                                                                                   http://www.globalsino.com/EM/        

This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.


Figure 3235 shows the typical sizes of various material defects and the capability of analytical techniques (See the full names of the techniques at page3928). The lowest levels of the techniques represent their spatial resolutions.

Comparison of various material defects in dimension

Figure 3235. Typical sizes of various material defects and capability of analytical techniques.


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