This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

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ELNES (near-edge fine structure) mapping is enabled by the fact that chemical bonding and short-range order in the environment of a specific chemical element induce a chemical shift of the energy-loss edge in the range between 0.1 and 8 eV and modifies the ELNES of the electron energy-loss spectrum. Therefore this method can differentiate between compounds of the same binary or multi-component system but with different bonding and valency.

Note that, in EELS analysis, high energy-resolution is necessary to observe ELNES for investigating the chemical bonding.