This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

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The high resolution TEM (HRTEM) imaging, showing the periodicity of the crystal, is fundamentally limited by the capability of the TEM instruments. Therefore, the capability of obtaining HRTEM image on a specific crystal depends on the size of the unit cell of the crystal structure of the observing material. For small unit cells, HRTEM images could be obtained only for the low-index zone axes, for instance, in many cubic crystals only for the three projections with the largest d spacings: [100], [111] and [110]. However, for big unit cells, not only the low-index zone axes but also some higher-index zone axes can be imaged at the high resolution conditions.