Aberration Dependence of Angle of Electron Rays
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/  



 
This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

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In SEMs and TEMs, the beam-limiting aperture confines the convergence angle of the electron beam to control the aberrations of the final lens.

On the other hand, at low angles (θ) of electron rays, the lower-order aberrations dominate.

 

 

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