Aberration in Well-aligned Electron Microscopes
- Practical Electron Microscopy and Database -
- An Online Book -

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This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

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For a well-aligned field emission electron source in EMs, based on the monochromatic approximation the energy-dependent terms in wave aberration function can be ignored.

 

 

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