This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.

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The inelastical phonon excitation of incident electrons is also known as thermal diffuse scattering (TDS). Phonon excitation and TDS cannot be distinguished and separated except when TDS is negligible at very low temperatures. Both effects contribute to the background of many types of EM images, diffraction patterns and spectra, and their contributions cannot be separated unless at low temperatures.

The energy changes of incident electrons associated with thermal diffuse scattering (TDS) are of the order of kT ≈ 0.05 eV and are too small to be measured by EELS tools because most EELS instruments have typical energy resolution of >0.1 eV.