Accuracy of CBED Patterns - Practical Electron Microscopy and Database - - An Online Book - |
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Microanalysis | EM Book https://www.globalsino.com/EM/ | ||||||||
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Due to the distortions inherent in electron lenses, it is important to calibrate the CBED patterns by comparing an unknown pattern from a known structure with standard diffraction angles. A difference of 10% or more is common at large angles, so that angular measurements taken from CBED patterns may contain such error. Therefore, a correcton table needs to be obtained for particular lens currents.
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