Extraction of Signal/Line Intensity in EELS
- Practical Electron Microscopy and Database -
- An Online Book -
|Microanalysis | EM Book https://www.globalsino.com/EM/|
For the single scattering spectrum, the overall intensity of the spectrum can be given by,
Equation 1390a can be re-written to represent the spectrum as a power-law background and core-loss profile for each edge:
The core-loss profiles can be calculated using elemental standards of known thickness and composition. Or, a more accurate way is that the profiles are measured experimentally. In multiple least-squares (MLS) fitting, the weightings of the contribution of each element are adjusted by and their values converted to relative concentrations.
In general, before intensity extraction in EELS analysis, plural scattering should be removed first (see page4352) if the data acquisition is not performed on a thin (<30 nm) TEM specimen.
Different methods have been proposed to extract the intensity of the peaks in an EEL spectrum: [1 - 3]
 Riedl T, Gemming T, Wetzig K, Extraction of EELS white-line intesities of manganese compounds: Methods, accuracy and
valence sensitivity, Ultramicroscopy, 2006; 106: 284-291.