This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

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In EMs (especially in TEMs), as the electron beam intensity (or called as current) is increased, some effects occur:

        i) Local heating in the specimen increases. This heating effect produces differential thermal expansion at the observation location and thus induces specimen drift,
        ii) Carbon contamination increases,
        iii) Electrical charging effect may increase,
        iv) The illumination coherence is reduced.