Common Acronyms/Abbreviations used in Microscopy and Materials
- Practical Electron Microscopy and Database -
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Table 4302 lists the common acronyms (abbreviations) used in microscopy and other techniques, and materials. The electron microscopy (EM)-based acronyms have especially been labeled.

Table 4302. Common acronyms/abbreviations used in microscopy and other techniques, and materials.

Acronym
Full name
ADF*

Annular dark field

AES
Auger electron spectroscopy
BEI*
Backscattered electron imaging
BF TEM*
Bright field TEM
CBED
Convergent beam electron diffraction
CL
Cathodoluminescence
Eenergy Dispersive X-ray Spectra
EELS*
Electron energy-loss spectroscopy
ESEM*
Environmental SEM
ETEM*
Environmental TEM
FESEM*
Fiel emission SEM
HAADF*
High angle annular dark field
HREM*
High resolution electron microscopy
HRTEM*
High resolution transmission electron microscopy
HVEM*
High voltage TEM
IVEM*

Intermediate voltage TEM

LAMMA
Laser microprobe mass analysis
LEAP
Local electrode atom probe
PIXE
Proton-induced x-ray emission
PEM or PEEM
Photoelectron microscopy
RBS
Rutherford backscattering spectroscopy
SAED
Selected-area electron diffraction
SEI*
Secondary electron imaging
SEM*
Scanning electron microscope
SIMS
Secondary ion mass spectrometry
STEM*
Scanning TEM
TEM*
Transmission electron microscope
TEMT*

TEM tomography

UPS
Ultraviolet photoelectron spectroscopy
VPSEM*
Variable pressure SEM
XAS
X-ray absorption spectroscopy
XES
X-ray emission spectroscopy
XPS
X-ray photoelectron spectroscopy
XRD
X-ray diffraction
XRF
X-ray fluorescence spectroscopy
* Electron microscopy (EM)-based acronyms.

 

 

 

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