Practical Electron Microscopy and Database

An Online Book, Second Edition by Dr. Yougui Liao (2006)

Practical Electron Microscopy and Database - An Online Book

Chapter/Index: Introduction | A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z | Appendix

EELS of tin (Sn)

The nearly free electrons in the metallic tin (Sn) comprising the conduction bands give rise to the plasmon excitations of Ebulk = √2Esurface. Therefore, the predominant peaks originated from surface- and bulk-plasmon losses are at 10 and 14 eV respectively.

Figure 2300 shows REELS profiles taken from a polycrystalline Sn surface using a 200-eV primary beam, an incidence angle of 45°, and different collection angles β. The spectrum taken at the collection angle of 80° is the most surface sensitive of the three with the strongest peak of the surface-plasmon loss at 10 eV, and the one taken at 0° is the most bulk sensitive with the strongest peak of the bulk-plasmon loss at 14 eV. The dependence of the REELS signal on the collection angle is discussed in page2301.

REELS profiles taken from a polycrystalline Sn surface using a 200-eV primary beam, an incidence angle of 45°, and different collection angles β

Figure 2300. REELS profiles taken from a polycrystalline Sn surface using a 200-eV primary beam, an incidence angle of 45°, and different collection angles β. Adapted from [1]

 

 

 

 

 

 

 

[1] Gar B.Hoflund and Gregory R. Corallo, Electron-energy-loss study of the oxidation of polycrystalline tin, Phys. Rev. B 46, 7110–7120 (1992).