Chapter/Index: Introduction | A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z | Appendix
| The beam blanking deflectors in both EMs and FIB have similar functions. In this case, an electrostatic deflector is used to rapidly switch an electron beam on and off by deflecting or blanking the beam during specific intervals. This creates pulsed electron bursts. The key features of beam blanking with electrostatic deflectors are:
The Electrostatic Dose Modulator (EDM) developed by JEOL is an advanced beam blanking system designed for use in TEM and STEM imaging. It features a fast pre-sample electrostatic deflector that switches the electron beam on or off in less than 20 nanoseconds, dramatically improving image clarity for fast exposure times. The EDM allows precise control over the electron dose applied to samples without altering the imaging conditions, making it ideal for experiments requiring dose structuring with pulses as short as 100 nanoseconds and frequencies up to 1 MHz. The system supports both TEM and STEM applications, with modern control software for programmable dose attenuation and logging, and integrates easily with other hardware. Its flexibility and speed enhance both standard imaging and dynamic experiments such as pump-probe dynamics. Table 2464 lists the function of each part in the FIB, including the beam blanking deflector. Table 2464. The function of each part in the FIB.
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