Effects of Electron Beam Current/Intensity Changes
- Practical Electron Microscopy and Database -
- An Online Book -


This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.


In EMs (especially in TEMs), as the electron beam intensity (or called as current) is increased, some effects occur:

        i) Local heating in the specimen increases. This heating effect produces differential thermal expansion at the observation location and thus induces specimen drift,
        ii) Carbon contamination increases,
        iii) Electrical charging effect may increase,
        iv) The illumination coherence is reduced.

All of these effects above reduce the resolution in the image.




The book author (Yougui Liao) welcomes your comments, suggestions, and corrections, please click here for submission. You can click How to Cite This Book to cite this book. If you let book author know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page.

Copyright (C) 2006 GlobalSino, All Rights Reserved