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Weak-beam (WB) Technique in TEM - Practical Electron Microscopy and Database - - An Online Book - |
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| Microanalysis | EM Book https://www.globalsino.com/EM/ | ||||||||
| This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers. | ||||||||
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A dislocation can be observed in TEM because the lattice near the dislocation core is bent elastically. The degree of bending increases when closer to the dislocation core. Dark-field imaging mode, also called weak-beam (WB) technique here, is normally used for dislocation imaging.
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| The book author (Yougui Liao) welcomes your comments, suggestions, and corrections, please click here for submission. If you let book author know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page. | ||||||||
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