Electron microscopy
Weak-beam (WB) Technique in TEM
- Practical Electron Microscopy and Database -
- An Online Book -
Microanalysis | EM Book                                                                                   https://www.globalsino.com/EM/        

This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.


A dislocation can be observed in TEM because the lattice near the dislocation core is bent elastically. The degree of bending increases when closer to the dislocation core. Dark-field imaging mode, also called weak-beam (WB) technique here, is normally used for dislocation imaging.



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