This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

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The shift of the electron probe in TEM systems often occurs when switching between the modes of convergent beam electron diffraction (CBED), nanobeam diffraction (NBD), STEM, and TEM imaging. The good conditions normally are that the probe moves by less than 10 nm relative to its previous location.