This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.

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Fourier transform plays an important role in HRTEM imaging and analysis.

The phases of the Fourier components of the HRTEM (high-resolution TEM) images are determined by two ways:

          i) The Fourier components at sinχ(u) > 0 have the same phases as the phases of structure factors. This raises the same contrast in the image as the projected potential.

          ii) The Fourier components at sinχ(u) < 0 have a phase change of 180°. This raises a reversed contrast in the image.

In general, the HRTEM images are usually formed by the combination of those two Fourier components above.