This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.

=================================================================================

In EELS measurements, in order to produce a sufficient signal-to-noise ratio, a minimum electron dose for a specific material is needed. For instance, for Mn-containing minerals, the minimum integrated dose for each accumulated spectrum should be more than 2 × 10⁶ e/nm².

If the TEM specimen is very fragile and is easily damaged during the observation, the experiment must be done with the minimum dose of electron beam. In such cases, the signal acquisition is needed to be compromised by costing some benefits. For instance, the counting efficiency of EELS linescan can be optimized at the cost of energy resolution by binning multiple channels.