M-family of Characteristic X-Ray Emission
- Practical Electron Microscopy and Database -
- An Online Book -



This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.



The M family of characteristic X-rays observed by EDS involves Mα(1), Mβ(0.6), Mγ(0.05), Mζ(0.06), and MIINIV(0.01). Different from the K-family, the numbers in the parentheses present approximate relative intensities, since these intensities vary with the over-voltage and with the element in question .




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