This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

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In energy-filtered TEM (EFTEM) imaging mode, the best to do is that the electron beam energy is increased to preserve image focus. With the “Offset” control on EFTEM interface, the value of the energy loss is chosen. By using the high voltage (tension) offset, an ionization edge can be shifted into focus on slit opening position where the zero loss was located previously. If no slit is applied, the other edges also appear at their corresponding energies but blurred in the vertical direction due to the chromatic aberration.