La2O3
- Practical Electron Microscopy and Database -
- An Online Book -

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This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

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Table 2067. Properties of amorphous La2O3.

Static dielectric constant (K)
30
Conduction band (CB) offset on silicon substrate
2.3
Band gap energy (eV)
6

 

 

 

 

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