Image-shift Function and its Lens in TEM
- Practical Electron Microscopy and Database -
- An Online Book -

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This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

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Figure 2761 shows the position of the deflector applied to image-shift function in TEM. This function is mostly useful when a small change of interesting area is needed during high resolution imaging.

Schematics illustrating the position of the deflector applied to image-shift function in TEM

Figure 2761. Schematics illustrating the position of the deflector applied to image-shift function in TEM.

In the technique of precession electron diffraction (PED), to obtain a stationary diffraction pattern instead of ring reflections, a simultaneous descan of the diffracted beam is needed by means of image shift TEM coils.

 

 

 

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The book author (Yougui Liao) welcomes your comments, suggestions, and corrections, please click here for submission. If you let book author know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page.