Shift of Electron Beam in EMs
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/  



 
This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

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A deflector for electron-beam deflection in EMs has been applied to align, tilt, shift, scan the electron beam, and so on. The deflector, usually including a pair of deflection coils, is called the double-deflection system. Similar to the operation of tilting the electron beam only, shifting the electron beam only can also be achieved by optimizing the defector balance.

On the other hand, Figure 3658 shows the schematic illustration of dipole design which can be used for electron beam shift. indicates the direction of the electron beam, in parallel with the optical axis. The blue lines represent the magnetic field lines, while the red line represents the Lorentz force on the electrons.

Schematic illustration of dipole design which can be used for spherical aberration (Cs) correction

Figure 3658. Schematic illustration of dipole design which can
be used for electron beam shift.

 

 

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