This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

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By increasing the accelerating voltage in EMs it is possible to have the contrast transfer function (CTF) extend to higher spatial frequencies and thus have high spatial resolution. However, at the same time the microscope itself increases in size and cost and the samples will be damaged faster and more easily.