Practical Electron Microscopy and Database

An Online Book, Second Edition by Dr. Yougui Liao (2006)

Practical Electron Microscopy and Database - An Online Book

Chapter/Index: Introduction | A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z | Appendix

HfSiO4

Table 2068. Properties of amorphous HfSiO4.

Static dielectric constant (K)
11
Conduction band (CB) offset on silicon substrate
1.8
Band gap energy (eV)
6.5