Chapter/Index: Introduction | A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z | Appendix
| Spherical-aberration (Cs) correction results in a reduced depth of focus (DoF) with the increase in the convergence angle θ, therefore, the three-dimensional (3-D) sectioning of the samples using STEM [1,2] can be improved. However, the achievable vertical information in real systems would also depend on many sample-related factors, for instance, channelling effect.
[1] Borisevich AY, Lupini AR, Pennycook SJ. Proc Natl Acad Sci USA 2006;103:3044–8.
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