This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

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Many experimental settings for EM demonstrations are often impractical for actual materials characterizations. For instance, for high-resolution EELS demonstrations, many results are obtained with low emission-current to reduce the energy spread. An example is that the probe current of 8.5 pA is applicable for low-loss spectroscopy, but is not sufficient to observe a core-loss spectrum.