Optimized Electron Beam Current for EELS/EFTEM Measurements
- Practical Electron Microscopy and Database -
- An Online Book -


This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.


In EELS and EFTEM measurements, the electron beam current needs to be optimized in order to have a proper condition:

         i) The beam current cannot be too high because high current will cause specimen damage,

         ii) The beam current cannot be too low in order to have enough signals. For instance, in the case of core-loss spectroscopy, high beam current is required to detect the low-intensity signals.

On the other hand, lower beam current in the same electron source can be used to reduce the energy spread.



The book author (Yougui Liao) welcomes your comments, suggestions, and corrections, please click here for submission. If you let book author know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page.