Tilt HAAD STEM Tomography
- Practical Electron Microscopy and Database -
- An Online Book -


This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.


The HAADF (high-angle annular dark-field) STEM imaging has widely been applied in tilt electron tomography because it shows Z-contrast. However, in this technique, we still need to suppress the unwanted diffraction contrast.

In metallurgy, HAAD STEM tomography is especially useful for studying the morphologies and distributions of precipitates in steels and alloys.

However, for very thick specimens or those with high mass density, HAADF STEM imaging is no longer applicable to tomography study as the signal decreases with increase of the specimen thickness because more scattering proportionately occurs outside the outer edge of the annular detector.





The book author (Yougui Liao) welcomes your comments, suggestions, and corrections, please click here for submission. If you let book author know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page.