Practical Electron Microscopy and Database

Chapter/Index: Introduction | A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z | Appendix

Energy Filter Applied to Observation of Kikuchi Lines and Bands

There is a contribution of inelastically scattered electrons to the conventional electron diffraction patterns (refer to thickness dependence and atomic number dependence) so that energy filtering at high energy losses can be used to separate the contributions from plasmon and inner-shell ionization losses to Kikuchi lines and bands.