This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.

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CBED patterns present the deficiency lines in the zero-order disc, which result from excitation of reflections in higher order Laue zones (HOLZ) and are called HOLZ lines. The positions of the HOLZ lines are related to the symmetry and lattice parameters of the crystal. They are changed in the direction of the applied stress if the material is stressed and those changes induce a change in the Bragg condition and thus a shift of the HOLZ lines. By analyzing their positions in combination with a reference CBED patern, a quantitative analysis of the three-dimensional (3-D) strain state of the crystal can be performed.