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Characteristic X-ray Energy versus Critical Ionization Energy
- Practical Electron Microscopy and Database -
- An Online Book -
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https://www.globalsino.com/EM/
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This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
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Critical ionization energy is also known as absorption edge energy, critical excitation energy, or X-ray absorption energy. The characteristic energy is value measured by our X-ray detector.
The value of the critical ionization energy (Ec) is higher than the associated characteristic (line) X-ray energy. The origin of the difference is because the atom doesn’t return completely to ground state when an X-ray is emitted. For instance, if the electron that fills a hole in the ionized inner shell comes from an outer shell this process will leave a hole in that outer shell. This hole will essentially be filled by another electron with perhaps the emission of another X-ray and so on until eventually a free electron from the conduction or valence band fills the last hole in the outermost core shell.
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The book author (Dr. Liao) welcomes your comments, suggestions, and corrections, please click here for submission. You can click How to Cite This Book to cite this book. If you let Dr. Liao know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page.
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